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Devices
Here you can find a list of all devices with their uses that our Institute owns for research purposes
Thermal methods

Heating stage
Observe temperature behavior up to 1500 °C under the microscope; max. 150 mg
Company: Linkam
Model: TS1500
![[Translate to English:] [Translate to English:]](/fileadmin/_processed_/d/f/csm_1_Erhitzungsmikroskop_b1_f8642b2169.jpg)
Heating microscope
Melting behavior, contact angle, viscosity fix points
Company: Hesse Instruments, Osterode
![[Translate to English:] [Translate to English:]](/fileadmin/_processed_/a/0/csm_1_Erhitzungsmikroskop2_510f6d228c.jpg)
Heating microscope
Melting behavior, contact angle, viscosity fix points
Company: Hesse-Instruments

Optical dilatometer
Thermal expansion coefficient, glass transformation temperature
Company: TA Instruments
Model: DIL 806
![[Translate to English:] [Translate to English:]](/fileadmin/_processed_/e/b/csm_1_LFA1_8584dbfa3f.jpg)
Laser Flash Apparatus (LFA)
Determination of thermal conductivity and thermal diffusivity, inert atmosphere, up to 1500 ° C
Company: Netzsch Model: LFA 427
![[Translate to English:] [Translate to English:]](/fileadmin/_processed_/a/4/csm_1_DSC_Pegasus_7ee91e25bf.jpg)
Differential scanning calorimetry (DSC)
Thermal analysis, cp
Company: Netzsch
Model: DSC 404 F3 Pegasus, DSC 404 cell
![[Translate to English:] [Translate to English:]](/fileadmin/_processed_/e/f/csm_1_TGADSC_e7dffad633.jpg)
Thermogravimetric analysis with differential scanning calorimetry
Gravimetric analysis with simultaneous differential thermal analysis
Company: Mettler Toledo, Model: TGA/DSC 3+
![[Translate to English:] [Translate to English:]](/fileadmin/_processed_/b/9/csm_1_FDSC_2c33b9a20b.jpg)
Flash Differential Scanning Calorimetry
Thermal analysis with very high heating and cooling rates from 0.1 to 40,000 K/s
Company: Mettler Toledo, Model: Flash DSC 2+
![[Translate to English:] [Translate to English:]](/fileadmin/_processed_/8/4/csm_1_STA-MS_2134909800.jpg)
Simultaneous thermal analysis - mass spectrometry (STA-MS)
Differential thermal analysis, thermogravimetry and detection of escaping gases
Company: Netzsch
![[Translate to English:] [Translate to English:]](/fileadmin/_processed_/d/5/csm_1_Vakuumofent_0ba2fc2bdb.png)
Vacuum furnace
Maximum 700 ° C, vacuum 1 * 10 ^ -2 mbar, recording p, T-course possible
![[Translate to English:] [Translate to English:]](/fileadmin/_processed_/e/3/csm_1_Klimakammer_86b15a01c3.jpg)
Environmental chamber
Temperatures from -40 °C to 150 °C at 30% to 95% RH
Company: ESPEC
Model: SH-241
![[Translate to English:] [Translate to English:]](/fileadmin/_processed_/1/6/csm_1_Isothermal_Kalorimeter2_d17216ba8f.jpg)
Isothermal calorimeter
Measurement of hydration energy, solutions and suspensions, between 5 to 90 ° C
Company: TA Instruments
Model: TAM Air
Viscometric methods
![[Translate to English:] [Translate to English:]](/fileadmin/_processed_/5/f/csm_2_Parallel-Platten-Viskosimeter_027f12ddb7.jpg)
Micro-indentation
Viscosity, parallel plate geometry or ball indenter
Company: Bähr Thermoanalyse
Model: VIS 404
![[Translate to English:] [Translate to English:]](/fileadmin/_processed_/3/8/csm_2_Balkenbiegeviskosimeter_31cb4ce130.jpg)
Beam-bending
Viscosity, beam bending geometry
Company: Bähr Thermoanalyse
Model: VIS 401
Microscopy and spectroscopy
![[Translate to English:] [Translate to English:]](/fileadmin/_processed_/a/7/csm_3_Spektrophotometer_Farbmessger%C3%A4t_2f172c9687.jpg)
Spectrophotometer, Colorimeter
Color location determination in different color spaces
Company: ColorLite
Model: sph850
![[Translate to English:] [Translate to English:]](/fileadmin/_processed_/0/7/csm_3_FTIR_f8fb7a721a.jpg)
Infrared spectrometer (FTIR)
Transmission, reflection, 1 - 25 μm
Company: Bruker
Model: VERTEX 70
![[Translate to English:] [Translate to English:]](/fileadmin/_processed_/7/1/csm_3_UV_VIS-Spektroskopie_cedaa720ed.jpg)
UV/VIS spektroscopy
Transmission, reflection, 190 - 1100 nm
Company: Analytik Jena
Model: SPECORD 200
![[Translate to English:] [Translate to English:]](/fileadmin/_processed_/0/c/csm_3_SNMS2_bd66d1c7c1.jpg)
Secondary neutral mass spectrometer (SNMS)
Atomic concentration profiles, nm depth resolution
Company: SPECS
Model: INA-X
![[Translate to English:] [Translate to English:]](/fileadmin/_processed_/a/9/csm_3_FIB-FESEM1_2057a02382.jpg)
Focused Ion Beam - Field-emission microscopy (FIB-FESEM)
Measurement methods: SEM, STEM, EBSD, EDX
Firma: FEI
Modell: Nanolab 600
![[Translate to English:] [Translate to English:]](/fileadmin/_processed_/8/3/csm_3_DigitalesLaserscanningMicroscop_cf845a9c01.jpg)
Digital laser scanning microscope
3D view, topography, surface roughness, surveying
Company: Keyence
Model: VK-9710
![[Translate to English:] [Translate to English:]](/fileadmin/_processed_/6/2/csm_3_Elektronische_Schallanalyse_ESA_2c9de582dd.jpeg)
Electrokinetic sound analysis
Isoelectric point, zeta potential
Company: Pa
Model: Feld ESA
![[Translate to English:] [Translate to English:]](/fileadmin/_processed_/4/c/csm_3_REM3_828c1fd4e9.jpg)
Scanning electron microscope (SEM)
Electron microscopy with EDX
Company: Zeiss
Model: EVO 50
![[Translate to English:] [Translate to English:]](/fileadmin/_processed_/d/e/csm_3_Lichtmikroskop_Leica_f0f8f2bdbe.jpg)
Optical microscope
Reflection and transmission mode, optical analysis
Company: Leica, Olympus, Zeiss
![[Translate to English:] [Translate to English:]](/fileadmin/_processed_/f/0/csm_3_Wei%C3%9Flichinterferometer_90fbbf0126.jpg)
White light interferometer
Surface topography, surface roughness, 8 mm lateral field of view
Company: FRT
Model: WLI PL
![[Translate to English:] [Translate to English:]](/fileadmin/_processed_/2/d/csm_3_Spektralphotometer_DrLange_d20c4bfbe5.jpg)
Spectrophotometer
Chemical analysis of anions and cations in aqueous solutions
Company: Dr. Lange
Model: CADAS 100
![[Translate to English:] [Translate to English:]](/fileadmin/_processed_/2/0/csm_3_UvVisIr-Spektroskopie_PerkinElmer_cdc820c816.jpg)
UV/VIS/IR spectroscopy
Solar transmission, reflection, 250 - 3000 nm, integration sphere
Company: PerkinElmer
Model: Lambda950
Physical methods
![[Translate to English:] [Translate to English:]](/fileadmin/_processed_/d/4/csm_4_Mikroindenter1_2f401d5a71.jpg)
Microindentation
Firma: Zwick&Roell
Modell: zwickiLine Z2.5 Hardness-Tester (ZHU 2.5)
![[Translate to English:] [Translate to English:]](/fileadmin/_processed_/3/2/csm_4_Profilometer_3ae7e0d4a5.jpg)
Profilometer
Surface roughness, layer thickness, depth of sputtering
Company: Tencor
Model: P-1
![[Translate to English:] [Translate to English:]](/fileadmin/_processed_/8/7/csm_4_Kontaktwinkel2_75d9714ef2.jpg)
Contact angle measuring instrument
Determination contact angle on surfaces, surface tension
Company: dataphysics
Model: OCA 15plus
![[Translate to English:] [Translate to English:]](/fileadmin/_processed_/d/a/csm_5_Glanzmessger%C3%A4t_3076931adf.jpg)
Glossmeter
Measurement of the gloss angle below 20° 60° 85°, reflection of the surface
Company: BYK Gardner
Model: micro-TRI-gloss
![[Translate to English:] [Translate to English:]](/fileadmin/_processed_/6/1/csm_4_Gyrator_ed57f6e917.jpg)
Gyratory compactor
Compaction of earth-moist samples
Company: Matest
Model: Gyrotronic - Superpave Gyratory Compactor
![[Translate to English:] [Translate to English:]](/fileadmin/_processed_/d/6/csm_4_Laser-Doppler-Vibrometer2_eeb55cd2ec.jpg)
Laser Doppler vibrometer
Elastic constants (modulus of elasticity)
Company: Polytec
![[Translate to English:] [Translate to English:]](/fileadmin/_processed_/6/d/csm_5_Schallmessger%C3%A4t_9d67b4d75b.jpg)
Sound measuring device
Determination of the speed of sound and the elastic constants
Firma: Krautkramer Branson
Modell: USD 15 S
![[Translate to English:] [Translate to English:]](/fileadmin/_processed_/c/f/csm_4_Laserbeugungs-Partikelgr%C3%B6%C3%9Fenanalyse_e7893e3ffe.jpg)
Laser diffraction analysis
Grain size distribution in the range 0.04 μm - 2000 μm
Company: Coulter
Model: LS 230
![[Translate to English:] [Translate to English:]](/fileadmin/_processed_/1/0/csm_4_BET_6ee403b6cf.jpg)
Accelerated surface and porosimetry system (BET)
Specific surface
Company: micromeritics
Model: ASAP 2020 Plus
![[Translate to English:] [Translate to English:]](/fileadmin/_processed_/c/9/csm_5_Schwindkegel_9e7d3905ce.jpg)
Shrinkage cone
Behavior of the change in length, shrinkage or elongation, temperature and humidity
Company: Schleibinger Testing Systems
Model: Shrinkage cone
![[Translate to English:] [Translate to English:]](/fileadmin/_processed_/1/c/csm_5_Gasabsorptionsanalyse_0d55587386.jpg)
Gas absorption analysis
Mixing and conditioning gases to examine e.g. Gas-solid reactions
![[Translate to English:] [Translate to English:]](/fileadmin/_processed_/3/3/csm_5_Ultraschallmesszelle_f%C3%BCr_Erstarrung1_eec673be21.jpg)
Ultrasonic measuring cell for solidification
Reaction courses, modulus of elasticity
Company: UltraTest
Model: Ultrasonic- Multiplex- Tester IP-8
![[Translate to English:] [Translate to English:]](/fileadmin/_processed_/a/d/csm_4_Edelgaspyknometer_5f54edf21d.jpg)
Noble gas pycnometer / Helium pycnometer
Determination of density, nuclear density
Company: POROTEC
Model: Pycnomatic-ATC
X-ray methods
![[Translate to English:] [Translate to English:]](/fileadmin/_processed_/d/2/csm_5_R%C3%B6ntgendiffraktometer1_Helsch_2f1389ee8a.jpg)
X-ray diffractionmeter (XRD)
Crystal phases, low / high temperature chamber (-190 °C to 1200 °C), thin layers
Company: Panalytical
Model: Empyrean
![[Translate to English:] [Translate to English:]](/fileadmin/_processed_/4/8/csm_5_R%C3%B6ntgendiffraktometer_Zellmann_fd5b7a4c03.jpg)
X-ray diffractionmeter (XRD)
Crystal phases
Company: Panalytical
Model: Empyrean
![[Translate to English:] [Translate to English:]](/fileadmin/_processed_/d/b/csm_5_RFA1_6b4e783868.jpg)
X-ray fluorescence spectrometer (XRF)
Chemical analyzes starting from atomic number 4
Company: Bruker AXS
Model: S4 pioneer