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Here you will find a list of all the equipment available at our institute and its intended use in research.
Thermal analysis with very high heating and cooling rates ranging from 100 to 40,000 K/s
Company: Mettler Toledo Model: Flash DSC 2+
Thermal analysis 30–1,400 °C, cp
Company: NetzschModel: DSC 404 F3 Pegasus, DSC 404 cell
Melting behavior, contact angle, viscosity fix points
Company: Hesse Instruments, Osterode
Company: Leitz
Heat treatment
In-situ determination of crystallization and melting behavior
Company: Yonekura
Temperatures ranging from -40 °C to 150 °C at 30% to 95% relative humidity
Company: ESPECModel: SH-241
Determination of thermal and electrical conductivity, inert atmosphere, up to 1500 °C
Company: Netzsch Model: LFA 427
Heating stage up to 1500 °C; observation of temperature behavior under a microscope; crystallization, melting; maximum sample mass: 150 mg
Company: Linkam
Coefficient of thermal expansion, glass transition temperature
Company: TA InstrumentsModel: DIL 806
Differential thermal analysis, thermogravimetry, and measurement of evolving gases
Company: Netzsch
Gravimetric analysis with simultaneous differential thermal analysisManufacturer: Mettler Toledo, Model: TGA/DSC 3+
Viscosity, beam bending geometry
Company: Bähr ThermoanalyseModel: VIS 401
Viscosity, parallel-plate geometry, or ball indenter
Company: Bähr ThermoanalyseModel: VIS 404
Viscosity
Company: Thermo ScientificModel: HAAKE MARS III
Shear viscosity
Company: Haakemodel: RV 20
3D view, topography, surface roughness, measurement
Company: Keyence model: VK-9710
Topography, 3D view, structures, LIBS analysis (Laser-Induced Breakdown Spectroscopy)Company: KeyenceModel: VHX-7000N with 20–2000x objective and EA-300 LIBS
Measurement methods: SEM, STEM, EBSD, EDX
Company: FEIModel: Nanolab 600
Transmission, reflection, 1–25 µm
Company: Brukermodel: VERTEX 70
Reflected light and transmission, optical analysis
Company: Leica, Olympus, Zeiss
Measurement of stress-induced birefringence in transparent materials (linearly/circularly polarized light)
Company: Ilis GmbHModel: StrainScope flex convertible
Confocal Raman microscope, 532 nm + 633 nm lasers
Company: WITecModel: alpha300R
Electron microscopy with EDX
Company: ZeissModel: EVO 50
Atomic concentration profiles, nm depth resolution
Company: SPECSModel: INA-X
Chemical analysis of anions and cations in aqueous solutions
Company: Dr. LangeModel: CADAS 100
Color position determination in various color spaces
Company: ColorLitemodel: sph850
Transmission, reflection, 190–1100 nm
Company: Analytik JenaModel: SPECORD 200
Solar transmission, reflection, 250–3000 nm, integrating sphere
Company: PerkinElmerModel: LAMBDA950
Surface topography, surface roughness, 8 mm lateral field of view
Company: FRTModel: WLI PL
Density measurement, colony count
Company: POROTECModel: Pycnomatic-ATC
Measurement of the gloss angle at 20°, 60°, and 85°; surface reflectance
Company: BYK GardnerModel: micro-TRI-gloss
Determination of contact angles on surfaces, surface tension
Company: dataphysicsModel: OCA 15plus
Particle size distribution in the range of 0.04 µm–2,000 µm
Company: Coultermodel: LS 230
Company: Zwick/Roellmodel: zwickiLine Z2.5 hardness tester (ZHU 2.5)
Surface roughness, film thickness, sputtering depth
Company: BrukerModel: DektakXT Advanced System (DXT-A)
Determination of the speed of sound and the elastic constants
Company: Krautkramer BransonModel: USD 15 S
Reaction profiles, modulus of elasticity
Company: UltraTestModel: Ultrasonic Multiplex Tester IP-8
Crystal phases, low/high-temperature chamber (-190 to 1200 °C), thin films
Company: Panalyticalmodel: Empyrean
Crystal structure
Chemical analyses starting with atomic number 4
Company: Bruker AXSModel: S4 Pioneer
Chemical analyses starting with atomic number 11.
Company: Shimadzumodel: EDX-7000P
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